Technometrics: A journal of statistics for the physical, chemical and engineering sciences
David M. Steinberg
pág. 1
Technometrics: How It All Started.
David M. Steinberg, Soren Bisgaard
págs. 2-7
Nicolas W. Hergartner, Sarah E. Michalak, Bruce E. Takala, Stephen A. Wender
págs. 8-14
A Critical Assessment of Two-Stage Group Screening Through Industrial Experimentation.
A.E. Vine, S.M. Lewiis, A.M. Dean, D. Brunson
págs. 15-25
New E(S2)-Optimal Supersaturated Designs Constructed From Incomplete Block Designs.
Nam-Ky Nguyen, Ching-Shui Cheng
págs. 26-31
The False Discovery Rate for Multiple Testing in Factorial Experiments.
Maria Tripolski Kimel, Yoav Benjamini, David M. Steinberg
págs. 32-39
Sequential Change-Point Detection Methods for Nonstationary Time Series.
Hyunyoung Choi, Hernando Ombao, Bonnie Ray
págs. 40-52
Cramer-von Mises Tests for the Compatibility of Two Software Operating Environments.
Daniel R. Jeske, R.A. Lockhart, M.A. Stephens, Q. Zhang
págs. 53-63
Avoiding Problems With Normal Approximation Confidence Intervals for probabilities.
Yili Hong, William Q. Meeker, Luis A. Escobar
págs. 64-68
K. Krishnamoorthy, Thomas Mathew, Shubhabrata Mukherjee
págs. 69-78
On the Reliability of the Self-Dual k-Out-of-n Systems.
Francesc Carreras Escobar
, Josep Freixas Bosch , María Albina Puente del Campo págs. 79-85
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