Bayesian Reliability, Availability, and Maintainability Analysis for Hardware Systems Described Through Continuous Time Markov Chains

• Autores: Javier Cano, Javier Martínez Moguerza , David Ríos Insua
• Localización: Technometrics: A journal of statistics for the physical, chemical and engineering sciences, ISSN 0040-1706, Vol. 52, Nº. 3, 2010, págs. 324-334
• Idioma: inglés
• DOI: 10.1198/tech.2010.08198
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