Technometrics: A journal of statistics for the physical, chemical and engineering sciences
The future of Industrial Statistics. A Panel Discussion.
David M. Steinberg, Soren Bisgaard, Necip Doganaksoy, Nicholas I. Fisher, Bert Gunter, Gerald Hahn, Sallie Keller-McNulty, Jon Kettenring, William Q. Meeker, Douglas C. Montgomery, C.F. Jeff Wu
págs. 103-127
Analysis Of Window-Observation Recurrence Data.
Jianying Zuo, William Q. Meeker, Huaiqing Wu
págs. 128-143
Debasis Kundu
págs. 144-154
Multivariate Exponentially Weighted Moving Covariance Matrix.
Douglas M. Hawkins, Edgard M. Maboudou-Tchao
págs. 155-167
Tirthankar Dasgupta, Abhyuday Mandal
págs. 167-181
Bayesian inference for Multivariate ordinal Data Using Parameter Expansion.
Earl Lawrence, Derek Bingham, Chuanhai Liu, Vijayan N. Nair
págs. 182-191
Bayesian Hierarchical Modeling for Integrating Low-Accuracy and High-Accuracy Experiments.
Peter Z.G. Qian, C.F. Jeff Wu
págs. 192-204
Using Orthogonal Arrays in the Sensitivity Analysis of Computer Models.
Max D. Morris, Leslie M. Moore, Michael D. McKay
págs. 205-215
Loss Function Approaches to Predict a Spatial Quantile and its Exceedance Region.
Jian Zhang, Peter F. Craigmile, Noel Cressie
págs. 216-227
A note on Computing the Probability and Critical Values for the Half-Normal Plot.
Georges H. Guirguis
págs. 228-229
Correction. Letter to the Editor: Response to Easterlings Review of Modern Experimental Design.
Thomas P. Ryan
pág. 231
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