Sequential Designs Based on Bayesian Uncertainty Quantification in Sparse Representation Surrogate Modeling.

• Autores: Ray-Bing Chen, Weichung Wang, C.F. Jeff Wu
• Localización: Technometrics: A journal of statistics for the physical, chemical and engineering sciences, ISSN 0040-1706, Vol. 59, Nº. 2, 2017, págs. 139-152
• Idioma: inglés
• DOI: 10.1080/00401706.2016.1172027
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