Fermín S. V. Bazán, Juliano B. Francisco, Koung Hee Leem, G. Pelekanos
Kirsch�s factorization method is a fast inversion technique for visualizing the profile of a scatterer from measurements of the far-field pattern. We present a Tikhonov parameter choice approach based on a maximum product criterion (MPC) which provides a regularization parameter located in the concave part of the L-curve on a log�log scale.
The performance of the method is evaluated by comparing our reconstructions with those obtained via the L-curve, Morozov�s discrepancy principle and the SVD-tail. Numerical results that illustrate the effectiveness of the MPC in reconstruction problems involving both simulated and real data are reported and analyzed.
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