Bayesian reliability analysis when multiple early failures may be present
- Autores: Samir K. Bhattacharya, Ravinder K. Tyagi
- Localización: Trabajos de estadística, ISSN 0213-8190, Vol. 6, Nº. 1, 1991, págs. 17-26
- Idioma: inglés
- DOI: 10.1007/bf02863669
- Títulos paralelos:
- Análisis bayesiano de fiabilidad con la posible presencia de múltiples fallos tempranos
- Enlaces
-
Resumen
This paper discusses the Bayesian reliability analysis for an exponential failure mode on the basis of some ordered observations when the first p observations may represent early failures or outliers. The Bayes estimators of the mean life and reliability are obtained for the underlying parametric model referred to as the SB(p) model under the assumption of the squared error loss function, the inverted gamma prior for scale parameter and a generalized uniform prior for the nuisance parameter
¿Es nuevo? Regístrese
Ventajas de registrarse
