Technometrics: A journal of statistics for the physical, chemical and engineering sciences
Case-Deletion Diagnostics for Linear Mixed Models.
Jianxin Pan, Yu Fei, Peter Foster
págs. 269-281
Pointwise and simultaneous Tolerance LImits Under Logistic Regression.
Zachary Zimmer, DoHwan Park, Thomas Mathew
págs. 282-291
A Test of Stationarity for Textured Images.
Sarah L. Taylor, Idriis A. Eckley, Matthew A. Nunes
págs. 291-301
The Inverse Gaussian Process as a Degradation Model.
Zhi-Sheng Ye, Nan Chen
págs. 302-312
A Piecewise Single-Index Model for Dimension Reduction.
Tianhao Wang, Yingcun Xia
págs. 312-324
Statistical Process Control Using a Dynamic Sampling Scheme.
Zhonghua Li, Peihua Qiu
págs. 325-335
Time-Between-Event Control Charts for Sampling Inspection.
Liang Qu, Zhang Wu, Michael B.C. Khoo, Abdur Rahim
págs. 336-346
Kehui Chen, Hans-Georg Müller
págs. 347-358
John Grego, Shuang Li, James Lynch, Jayaram Sethuraman
págs. 359-371
Surrogate Modeling of Computer Experiments With Different Mesh Densities.
Rui Tuo, C.F. Jeff Wu, Dan Yu
págs. 372-380
Bayesian Uncertainty Quantification for Subsurface Inversion Using a Multiscale Hierarchical Model.
Anirban Mondal, Bani Mallick, Yalchin Efendiev, Akhil Datta-Gupta
págs. 381-392
A Bayesian Nonparametric Test for Minimal Repair.
Li Li, Timothy Hanson, Paul Damien, Elmira Popova
págs. 393-406
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