Caracterización de materiales a través de medidas de microscopía electrónica de barrido (SEM)

• Clavijo, Josué ^[1]
  1. [1] Universidad de América
• Localización: Elementos, ISSN-e 2248-5252, Vol. 3, Nº. 3, 2013 (Ejemplar dedicado a: Elementos), págs. 133-146
• Idioma: español
• DOI: 10.15765/e.v3i3.420
• Títulos paralelos:
  • Characterization of materials through SEM measures
• Enlaces
  • Texto completo (pdf)
• Resumen
  • español

    La microscopía de barrido electrónico (SEM) es una técnica de obtención de imágenes ampliamente utilizada en investigación de materiales debido a su alta resolución y capacidades de analizar características morfológicas, estructurales y químicas de las muestras bajo estudio. En este documento revisamos los fundamentos tanto conceptuales como de funcionamiento y utilidad de las imágenes que resultan de una medida de SEM, relacionando todo con el material más usado en fotocatálisis eterogénea, el ióxido de titanio (TiO2).

  • English

    SEM is an image generation technique widely used on materials researchdue its high-resolution capabilities and proven aptitude to unveil morphological, structural and even chemical features of a given sample.This paper brings out a concise review of the fundamentals, instrumental details and usefulness of the resulting SEM images. All of the concluding facts were thus related with the most important hotocatalyst: TiO2.

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